DocumentCode :
1295866
Title :
Assessment of the performance of zener references of the highest quality
Author :
Roberts, Derek E. ; Spreadbury, Peter J.
Author_Institution :
Engineering Department, University of Cambridge, Trumpington Street, Cambridge CB2 1P2, England
Issue :
4
fYear :
1987
Firstpage :
913
Lastpage :
917
Abstract :
Zener diodes are now playing an important part in the development of transfer voltage standards. The computer-controlled equipment that is described is capable of measuring these devices to 1 part in 107 at the 6-V level. A technique is described for characterizing the data obtained at various currents and temperatures in order to produce quantitative figures for the important parameters of zener diodes. The results and application of this method are discussed.
Keywords :
Computational modeling; Current measurement; Mathematical model; RNA; Standards; Temperature measurement; Voltage measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1987.6312581
Filename :
6312581
Link To Document :
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