DocumentCode :
1295948
Title :
A Theoretical Analysis of the Role of Ambipolar Diffusion in Charge-Carrier Transport in a Quasi-Neutral Region Under High Injection
Author :
Edmonds, Larry D.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume :
58
Issue :
5
fYear :
2011
Firstpage :
2459
Lastpage :
2469
Abstract :
A recent theoretical analysis considered charge collection from an ionization source in a p-n junction silicon diode under steady-state conditions, i.e., carrier liberation is at a quasi-constant rate, and concluded that the quasi-neutral region partitions into distinct sub-regions. A later empirical investigation (via TCAD simulations) found that this partitioning also applies under transient conditions, but a theoretical explanation was not given for the transient problem. The theoretical analysis given here provides that explanation, and also explains why a charge-collection model derived under steady-state conditions gives correct predictions for the transient problem.
Keywords :
p-n junctions; particle beam injection; silicon radiation detectors; ambipolar diffusion; charge-carrier transport; charge-collection model; high injection; high-resistance region; ionization source; p-n junction silicon diode; quasineutral region; steady-state conditions; transient conditions; transient problem; Charge carrier density; Doping; Equations; Mathematical model; Predictive models; Steady-state; Transient analysis; Ambipolar diffusion; ambipolar region (AR); charge collection; drift-diffusion; high-resistance region (HRR); quasi-neutral region (QNR); regional partitioning;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2011.2161884
Filename :
5982112
Link To Document :
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