A new two-port scattering matrix measurement technique using a sliding load

The measurement of the scattering matrix at microwave frequencies has traditionally involved frequent connections and disconnections of loads, which tend to reduce the precision and repeatability of measurements. This paper introduces a new reciprocal two-port scattering matrix measurement method based on the use of a sliding load connected to the device under test. It then becomes possible to calculate the scattering matrix by simple graphical means.