The recording and processing of pulsed laser diode spectra

A system capable of measuring and statistically analyzing wavelength and intensity fluctuations in pulsed-laser-diode output beams has been developed. The snapshot wavelength-intensity performance of laser diodes emitting discrete short-duration optical pulse is determined by isolating and recording individual pulses. Statistical processing of the resultant data generates information about the magnitude and/or frequency of occurrence of power variations of wavelength fluctuations in narrow optical bands. The system configuration, along with plots depicting results based on measurements taken for various laser diodes, are presented.