DocumentCode :
1296223
Title :
SiC Wirebond Multichip Phase-Leg Module Packaging Design and Testing for Harsh Environment
Author :
Puqi Ning ; Rixin Lai ; Huff, D. ; Fei Wang ; Ngo, Khai D. T. ; Immanuel, V.D. ; Karimi, K.J.
Author_Institution :
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume :
25
Issue :
1
fYear :
2010
Firstpage :
16
Lastpage :
23
Abstract :
In order to take full advantage of SiC, a high-temperature wirebond package for multichip phase-leg power module using SiC devices was designed, developed, fabricated, and tested. The details of the material comparison and selection are described, thus culminating a feasible solution for high-temperature operation. A thermal cycling test with large temperature excursion (from -55??C to 250??C) was carried out to evaluate the thermomechanical reliability of the package. During the test, the substrate failed before other parts in 20 cycles. A sealing edge approach was proposed to improve the thermal reliability of the substrate. With the strengthening of the sealing material, the substrate, die-attachment, and wirebond assemblies exhibited satisfactoriness in the thermomechanical reliability tests. In order to evaluate the high-temperature operation ability of designed package, one prototype module was designed and fabricated. The high-temperature continuous power test shows that the package presented in this paper can perform well at 250??C junction temperature.
Keywords :
assembling; lead bonding; multichip modules; sealing materials; thermal management (packaging); thermomechanical treatment; SiC; die-attachment; high-temperature continuous power test; high-temperature wirebond package; material comparison; material selection; multichip phase-leg power module; prototype module; sealing material; substrate; temperature excursion; thermal cycling test; thermal reliability; thermomechanical reliability tests; wirebond assembly; wirebond multichip phase-leg module packaging design; Assembly; Materials reliability; Materials testing; Multichip modules; Packaging; Prototypes; Sealing materials; Silicon carbide; Temperature; Thermomechanical processes; High-temperature packaging; SiC devices;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2009.2027324
Filename :
5200533
Link To Document :
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