• DocumentCode
    1296329
  • Title

    Charge Amplifier With an Enhanced Frequency Response for SPM-Based Data Storage

  • Author

    Lee, Hyunjoong ; Woo, Jong-Kwan ; Nam, Hyo-Jin ; Jin, Won-Hyeog ; Jeong, Moongi ; Kim, Young-Sik ; Shin, Jin-Koog ; Kim, Suhwan

  • Author_Institution
    Dept. of Electr. Eng., Seoul Nat. Univ., Seoul, South Korea
  • Volume
    57
  • Issue
    9
  • fYear
    2010
  • Firstpage
    691
  • Lastpage
    695
  • Abstract
    Storage systems based on scanning probe microscopy incorporate an array of thermopiezoelectric cantilevers that require charge amplifiers with a wide frequency response but low power consumption. We use an improved frequency compensation method to enhance the in-band frequency response without requiring any additional power. Measurements show that the prototype chip draws the same 68 A at 1.8 V as an unmodified design but has a closed-loop frequency response that is ten times greater. The chip was fabricated in a 0.18-m standard CMOS process, and the charge amplifier core occupies 0.042 mm2.
  • Keywords
    CMOS integrated circuits; amplifiers; frequency response; low-power electronics; piezoelectric devices; scanning probe microscopy; CMOS process; SPM-based data storage; charge amplifier; closed-loop frequency response; current 68 A; frequency compensation method; scanning probe microscopy; size 0.18 mum; thermopiezoelectric cantilevers; voltage 1.8 V; Atomic force microscopy; Capacitors; Circuits; Educational technology; Energy consumption; Frequency response; Gain; Integrated circuit modeling; Memory; Microelectromechanical systems; Micromechanical devices; Operational amplifiers; Power demand; Scanning probe microscopy; Writing; CMOS; Charge amplifier; data storage; frequency compensation; lead zirconate titanate (PZT); microelectromechanical system (MEMS); scanning probe microscopy (SPM); thermopiezoelectric cantilever;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2010.2056030
  • Filename
    5549903