• DocumentCode
    1296423
  • Title

    Determination of the quantized hall resistance value by using a calculable capacitor at ETL

  • Author

    Shida, Katsunori ; Wada, Toshimi ; Nishinaka, Hidefumi ; Kobayashi, Minoru ; Yonezaki, Genta ; Igarashi, Takashi ; Nemoto, Toshio

  • Author_Institution
    Electrotechnical Laboratory, 1-1-4, Umezono, Sakuramura, Niihari-gun. Ibaraki, 305 Japan
  • Issue
    2
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    214
  • Lastpage
    217
  • Abstract
    We report the International System (SI) value of the quantized Hall resistance (RH) determined by using a calculable capacitor at the electrotechnical laboratory (ETL). As the result of our measurements at ETL, a most reliable value of h / e2 has been estimated as 25 812.8036 ΩSI with a systematic uncertainty of 0.25 ppm root sum square (rss) and a random error of 0.20 ppm one standard deviation (1σ).
  • Keywords
    Capacitors; Electrical resistance measurement; Resistance; Resistors; Silicon; Temperature measurement; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1987.6312671
  • Filename
    6312671
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1296423