Title :
Quantum Hall measurements from 4 K to 20 mK
Author :
Wood, Barry M. ; D´Iorio, M.
Author_Institution :
Division of Physics, National Research Council of Canada, Ottawa, Ont., Canada K 1 A 0R6
fDate :
6/1/1987 12:00:00 AM
Abstract :
We report on precision measurements of the quantum Hall resistance (QHR) in the temperature range of 20 mK to 4 K. These include intercomparisons of the ohm maintained at the National Research Council (OHM NRC) and the International System ohm (OHM SI) and the QHR. The effects of nonzero Rxx minima, sample inhomogeneity, nonohmic contacts, and dissipation are summarized.
Keywords :
Current measurement; Electrical resistance measurement; Magnetic field measurement; Resistance; Silicon; Temperature measurement; Voltage measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1987.6312672
