• DocumentCode
    1296455
  • Title

    The quantum Hall effect as a standard to define the laboratory unit of resistance

  • Author

    Schwitz, Wolfgang ; Bauder, Lucien ; Bühlmann, Hans-jörg ; Py, Marcel A. ; Ilegems, Marc

  • Author_Institution
    Swiss Federal Office of Metrology, CH-3084 Wabern/Bern, Switzerland
  • Issue
    2
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    240
  • Lastpage
    244
  • Abstract
    A measurement system has been developed to determine the resistance of integer quantum Hall plateaux relative to a room-temperature reference resistor network of nominally the same values. Silicon MOSFET and GaAs-AlGaAs samples have been successfully fabricated and measured. The results confirm that the integer quantum Hall effect (QHE) may be used to monitor a group of standard resistors comprising the laboratory unit of resistance. They demonstrate the feasibility of defining the laboratory unit of resistance by adopting a value for the quantum Hall resistance h/e2.
  • Keywords
    Hall effect; Resistance; Resistors; Standards; Temperature measurement; Uncertainty; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1987.6312677
  • Filename
    6312677
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1296455