• DocumentCode
    1296644
  • Title

    Automated measurement of current dependency of contact resistance in low current level switches

  • Author

    Ikeda, Hiroaki ; Ishida, Kimitaka ; Shirako, Kiyoshi

  • Author_Institution
    Department of Electronic Engineering, Chiba University, 1-33 Yayoi-cho, Chiba 260, Japan
  • Issue
    2
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    390
  • Lastpage
    393
  • Abstract
    The very low contact resistance of a mechanical switch is measured under a very low current level. The results are used to reveal the current dependency of the metal-to-metal contacts. The variation of the resistance indicates the characteristics of mechanical switches used especially in circuits having very low level signals. An automated measurement system is designed and used for testing purposes in a factory.
  • Keywords
    Contact resistance; Current measurement; Electrical resistance measurement; Noise; Noise measurement; Resistance; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1987.6312707
  • Filename
    6312707
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1296644