DocumentCode :
1296682
Title :
Guard Trace Design for Improvement on Transient Waveforms and Eye Diagrams of Serpentine Delay Lines
Author :
Shiue, Guang-Hwa ; Chao, Chia-Ying ; Wu, Ruey-Beei
Author_Institution :
Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
Volume :
33
Issue :
4
fYear :
2010
Firstpage :
1051
Lastpage :
1060
Abstract :
This paper investigates the utilization of the guard traces to improve the eye opening and jitter for serpentine delay lines. It is found that the guard trace can reduce the original time-domain transmission (TDT) and time-domain reflection (TDR) crosstalk noises by more than 50%, if shorted by only two grounded vias at both ends of the trace. The time domain analysis as well as the associated simple circuit modeling is presented to explain the occurrence of noise cancellation mechanism on the guard trace. In addition, narrow signal trace is proposed to improve the TDR waveform by compensating the impedance mismatch due to the inserted guard traces. Finally, the HSPICE simulation and time-domain measurements of crosstalk noises, TDR/TDT waveforms, and eye diagrams are performed to validate the proposed analysis and design.
Keywords :
SPICE; circuit CAD; crosstalk; delay lines; jitter; time-domain analysis; waveform analysis; HSPICE simulation; circuit modeling; crosstalk noises; eye diagrams; guard trace design; jitter; serpentine delay lines; time-domain reflection; time-domain transmission; transient waveforms; Acoustic reflection; Analytical models; Circuit simulation; Conductors; Crosstalk; Delay lines; Impedance; Integrated circuit modeling; Jitter; Noise; Noise cancellation; Noise measurement; Strips; Time domain analysis; Crosstalk; eye diagram; grounded via; guard trace; serpentine delay line; signal integrity (SI); time-domain reflection (TDR); time-domain transmission (TDT);
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2010.2064165
Filename :
5549956
Link To Document :
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