• DocumentCode
    1296817
  • Title

    Precision millimeter-wave measurements of complex refractive index, complex dielectric permittivity, and loss tangent of common polymers

  • Author

    Afsar, Mohammed Nurul

  • Author_Institution
    Department of Electrical Engineering, The City College of the City University of New York, New York, NY; Massachusetts Institute of Technology, Cambridge, MA 02139
  • Issue
    2
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    530
  • Lastpage
    536
  • Abstract
    Our improved dispersive Fourier transform technique applied to a polarizing two-beam interferometer enables us to provide high-precision continuous spectra of complex refractive index, complex dielectric permittivity, and loss tangent of polyethylene, polypropylene, poly-4 methyl pentene-1 (TPX), polytetrafluorethylene, Plexiglas, acrylic, and nylon over the frequency range 50–300 GHz. The first four are nonpolar polymers and exhibit extremely low-loss characteristics. The last three are typical polar polymers, but they exhibit nearly 20 to 30 times higher loss compared to nonpolar polymers.
  • Keywords
    Absorption; Dielectrics; Millimeter wave technology; Plastics; Polyethylene; Refractive index;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1987.6312733
  • Filename
    6312733