Title :
Precision millimeter-wave measurements of complex refractive index, complex dielectric permittivity, and loss tangent of common polymers
Author :
Afsar, Mohammed Nurul
Author_Institution :
Department of Electrical Engineering, The City College of the City University of New York, New York, NY; Massachusetts Institute of Technology, Cambridge, MA 02139
fDate :
6/1/1987 12:00:00 AM
Abstract :
Our improved dispersive Fourier transform technique applied to a polarizing two-beam interferometer enables us to provide high-precision continuous spectra of complex refractive index, complex dielectric permittivity, and loss tangent of polyethylene, polypropylene, poly-4 methyl pentene-1 (TPX), polytetrafluorethylene, Plexiglas, acrylic, and nylon over the frequency range 50–300 GHz. The first four are nonpolar polymers and exhibit extremely low-loss characteristics. The last three are typical polar polymers, but they exhibit nearly 20 to 30 times higher loss compared to nonpolar polymers.
Keywords :
Absorption; Dielectrics; Millimeter wave technology; Plastics; Polyethylene; Refractive index;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1987.6312733