• DocumentCode
    129713
  • Title

    A novel method for measuring dielectric charging of CMUT arrays

  • Author

    Wong, Lawrence L. P. ; Shuai Na ; Chen, Albert I. H. ; Yeow, John T. W.

  • Author_Institution
    Dept. of Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2014
  • fDate
    3-6 Sept. 2014
  • Firstpage
    185
  • Lastpage
    188
  • Abstract
    A novel method to detect the bias voltage shift caused by dielectric charging in immersed CMUT arrays is proposed. The proposed method uses acoustic crosstalk as a means of coupling ultrasonic signal from the transmitting element to the receiving element, thus no additional equipment is required except the standard driving circuits and amplifiers in CMUT systems. Continuous sinusoid waves with and without dc offset were used in experiments and output signals caused by acoustic crosstalk with peak to peak amplitudes in the range of 100-200mV were observed. The calculation of bias voltage shift was illustrated graphically. The array was then intentionally charged and a change of voltage shift in the correct direction was observed using the same method. The proposed method can be modified to use unipolar square pulses, thus enabling real time monitoring and automatic calibration of CMUT arrays.
  • Keywords
    acoustic wave interference; capacitive sensors; charge measurement; crosstalk; electric charge; ultrasonic transducer arrays; acoustic crosstalk; amplifiers; automatic calibration; bias voltage shift; continuous sinusoid waves; dc offset; dielectric charging measurement; immersed CMUT arrays; real time monitoring; receiving element; standard driving circuits; transmitting element; ultrasonic signal coupling; unipolar square pulses; voltage 100 mV to 200 mV; Acoustic measurements; Acoustics; Crosstalk; Dielectric measurement; Dielectrics; Ultrasonic variables measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2014 IEEE International
  • Conference_Location
    Chicago, IL
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2014.0047
  • Filename
    6932171