DocumentCode :
1297245
Title :
The Radiation Hardness Assurance Facility at INFN-LNS Catania for the Irradiation of Electronic Components in Air
Author :
Menichelli, Mauro ; Alpat, Behcet ; Papi, Andrea ; Sorensen, Reno Harboe ; Cirrone, Giuseppe Antonio Pablo ; Ferrera, Francesco ; Figuera, Pierpaolo ; Finocchiaro, Paolo ; Lattuada, Marcello ; Rifuggiato, Danilo ; Bizzarri, Fabrizio ; Caraffini, Diego ; P
Author_Institution :
Ist. Naz. di Fis. Nucleare, Sezione di Perugia, Perugia, Italy
Volume :
57
Issue :
4
fYear :
2010
Firstpage :
2074
Lastpage :
2078
Abstract :
This paper describes the beam flux monitoring system that has been developed at the Superconducting Cyclotron at INFN-LNS (Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali del Sud, Catania, Italy) in order to monitor the beam parameters such as energy, flux, beam profile, for SEE (Single Event Effects) cross-sections determination and DD (Displacement Damage) studies. In order to have an accurate and continuous monitoring of beam parameters we have developed fully automatic dosimetry setup to be used during SEE (with heavy ions) and DD (with protons up to 60 MeV) tests of electronic devices and systems. The final goal of our activity is to demonstrate that the operation of such a system in air is not detrimental to the accuracy on controlling the beam profile, energy and fluence delivered onto the DUT (Device Under Test) surface, even with non relativistic heavy ions. We have tested our beam monitoring system with the “Reference SEU monitor” developed by ESA/ESTEC, the results are discussed here.
Keywords :
cyclotrons; dosimetry; ion accelerators; particle beam diagnostics; proton effects; DUT surface; INFN-LNS Catania; LNS superconducting cyclotron; automatic dosimetry setup; beam flux monitoring system; beam parameter monitoring; electronic component irradiation; electronic devices; nonrelativistic heavy ions; radiation hardness assurance facility; reference SEU monitor; single event effects; Calibration; Computerized monitoring; Condition monitoring; Cyclotrons; Detectors; Dosimetry; Electronic components; Electronic equipment testing; Ions; Laboratories; Laser beams; Measurement by laser beam; Monitoring; Particle beams; Protons; Silicon; System testing; Dosimetry; heavy ion accelerators; radiation effects; radiation tests;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2049582
Filename :
5550324
Link To Document :
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