DocumentCode
1297291
Title
Concurrent test method for OTA-C filters
Author
Lee, Kuen-Jong ; Huang, Kou-Shung ; Wang, Wei-Chung
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume
33
Issue
1
fYear
1997
fDate
1/2/1997 12:00:00 AM
Firstpage
1
Lastpage
2
Abstract
A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected
Keywords
active filters; circuit testing; concurrent engineering; design for testability; operational amplifiers; OTA-C filter; circuit under test; concurrent testing; testable design;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19970045
Filename
555034
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