DocumentCode :
1297689
Title :
Enhanced Implementations of Hamming Codes to Protect FIR Filters
Author :
Liu, Shih-Fu ; Reviriego, Pedro ; Maestro, Juan Antonio
Author_Institution :
Univ. Antonio de Nebrija, Madrid, Spain
Volume :
57
Issue :
4
fYear :
2010
Firstpage :
2112
Lastpage :
2118
Abstract :
Soft errors, especially those produced in harsh environments (as for example radiation), are a major concern for digital circuits. As technology shrinks, the failure probability of systems working in these environments is steadily growing. In order to tackle this issue, several design techniques are being used, which consider reliability as a key design parameter. Those based on redundancy, as Triple Modular Redundancy (TMR) and Hamming Codes, are especially popular, since they are quite straightforward to implement. However, this usually comes at a high cost, which many times is unfeasible for certain kinds of applications. Therefore, it is convenient to understand the structure and functionality of circuits in order take advantage of their inherent protection capabilities and therefore, minimize the extra redundancy. In this paper, this approach is used in order to optimize the protection of finite impulse response filters using Hamming codes.
Keywords :
FIR filters; Hamming codes; redundancy; FIR filter protection; Hamming codes; circuit functionality; digital circuits; finite impulse response filters; system failure probability; triple modular redundancy; Application specific integrated circuits; Clocks; Decoding; Digital circuits; Digital filters; Field programmable gate arrays; Finite impulse response filter; IIR filters; Integrated circuit technology; Protection; Redundancy; Silicon; Single event upset; Space missions; Tunneling magnetoresistance; Digital filters; Single Event Upset (SEU); hamming codes; reliability;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2051162
Filename :
5550429
Link To Document :
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