• DocumentCode
    1297707
  • Title

    Very high-frequency small-signal equivalent circuit for short gate-length InP HEMTs

  • Author

    Miras, Agnès ; Legros, Eric

  • Author_Institution
    Lab. de Bagneux, CNET, Bagneux, France
  • Volume
    45
  • Issue
    7
  • fYear
    1997
  • fDate
    7/1/1997 12:00:00 AM
  • Firstpage
    1018
  • Lastpage
    1026
  • Abstract
    A small-signal equivalent circuit for short gate-length InP high electron-mobility transistors (HEMTs) operating at very high frequency (HF) is proposed. First, the extrinsic parameters of the equivalent circuit are determined using a cold HEMT, but without forward gate bias. Then the intrinsic parameters of the equivalent circuit are extracted, including the frequency dependence of some of them. A fast and accurate method based on least-squares regressions is presented to obtain the extrinsic and intrinsic parameters from measured S-parameters. The improved equivalent circuit accurately fits the S-parameters of 0.25-μm InP HEMTs over the 500-MHz up to 40-GHz measurement bandwidth, for all gate-to-source and drain-to-source voltages
  • Keywords
    III-V semiconductors; S-parameters; UHF field effect transistors; equivalent circuits; high electron mobility transistors; indium compounds; least squares approximations; semiconductor device models; 0.25 micron; 500 MHz to 40 GHz; InP; S-parameters; least-squares regression; short gate-length InP HEMT; very high-frequency small-signal equivalent circuit; Current measurement; Equivalent circuits; Frequency dependence; HEMTs; Indium phosphide; MODFETs; Microwave measurements; Performance evaluation; VHF circuits; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.598436
  • Filename
    598436