• DocumentCode
    1297724
  • Title

    LMR 16-a self-calibration procedure for a leaky network analyzer

  • Author

    Silvonen, Kimmo

  • Author_Institution
    Fac. of Electr. Eng., Helsinki Univ. of Technol., Espoo, Finland
  • Volume
    45
  • Issue
    7
  • fYear
    1997
  • fDate
    7/1/1997 12:00:00 AM
  • Firstpage
    1041
  • Lastpage
    1049
  • Abstract
    A thru-match-reflect/line-match-reflect (TMR/LMR) self-calibration procedure based on the 16-term error model is shown. The error model takes into account all the leakage paths of a wafer prober, test fixture, and network analyzer. Simple closed-form calibration equations are presented. The method is very robust-zero leakage paths and symmetrical or matched-error networks can be handled equally well as more general cases. The algorithm is suitable for nonleaky network analyzers as well. The calibration is comprised of two-port measurement of the following standards: T(L), M-M, R-R, R-M, M-R. Two matched loads (M) are the only standards that have to be known in addition to the thru (T) or line (L). The reflection coefficient of the two identical reflection standards (R) is found in addition to the error parameters as in the normal TMR method. Experimental measurements with the LMR 16 have been made. All the possible combinations of five calibration standards for the 16-term error model are tabulated. The limitations of the super-thru-short-delay algorithm are defined for the first time
  • Keywords
    S-parameters; calibration; matrix algebra; measurement errors; measurement standards; microwave measurement; network analysers; 16-term error model; LMR 16; TMR/LMR calibration procedure; calibration standards; closed-form calibration equations; error parameters; leaky network analyzer; line-match-reflect; reflection coefficient; reflection standards; self-calibration procedure; super-thru-short-delay algorithm; thru-match-reflect; two-port measurement; Algorithm design and analysis; Calibration; Equations; Fixtures; Land mobile radio; Measurement standards; Reflection; Robustness; Semiconductor device modeling; Testing;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.598439
  • Filename
    598439