DocumentCode :
1297748
Title :
Stability analysis of semiconductor laser with phase-conjugate feedback
Author :
Murakami, Atsushi ; Ohtsubo, Junji ; Liu, Yun
Author_Institution :
Fac. of Eng., Shizuoka Univ., Japan
Volume :
33
Issue :
10
fYear :
1997
fDate :
10/1/1997 12:00:00 AM
Firstpage :
1825
Lastpage :
1831
Abstract :
The stability of the output power of a semiconductor laser with phase-conjugate feedback (PCF) is studied by numerical simulations based on the rate equations. We investigated the critical reflectivity at which the stable fixed output power evolves into periodic oscillation. As a result, we found that the critical reflectivity shows a periodic structure against the external cavity length and the stability is much enhanced at the periodic peak positions. The stability and dynamic behavior of a semiconductor laser with PCF are compared with those for conventional optical feedback. It is also found that the periods of the nearby peaks correspond to the frequency of the laser relaxation oscillation frequency and the stable peaks for the PCF are located at external lengths completely out of phase from those for the conventional feedback. Linear stability analysis using the rate equations is performed and the theoretical background for the stability is also given
Keywords :
bifurcation; laser feedback; laser stability; laser theory; numerical analysis; optical phase conjugation; reflectivity; semiconductor device models; semiconductor lasers; bifurcation diagrams; critical reflectivity; dynamic behavior; external cavity length; laser relaxation oscillation frequency; linear stability analysis; numerical simulations; output power stability; periodic oscillation; periodic structure; phase-conjugate feedback; rate equations; semiconductor laser; stability analysis; Equations; Frequency; Laser feedback; Laser stability; Optical feedback; Power generation; Power lasers; Reflectivity; Semiconductor lasers; Stability analysis;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.631288
Filename :
631288
Link To Document :
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