DocumentCode
1297770
Title
Estimation for maximum instantaneous current through supply lines for CMOS circuits
Author
Jiang, Yi-Min ; Krstic, Angela ; Cheng, Kwang-Ting
Author_Institution
Synopsys, Mountain View, CA, USA
Volume
8
Issue
1
fYear
2000
Firstpage
61
Lastpage
73
Abstract
We present new techniques for estimating the maximum instantaneous current through the power supply lines for CMOS circuits. We investigate four different approaches: (1) timed-ATPG-based approach; (2) probability-based approach; (3) genetic algorithm-based approach; and (4) integer linear programming (ILP) approach. The first three approaches produce a tight lower bound on the maximum current. The ILP-based approach produces the exact solutions for small circuits, and tight upper bounds of the solutions for large circuits. Our experimental results show that the upper bounds produced by the ILP approach combined with the lower bounds produced by the other three approaches confine the exact solution for the maximum instantaneous current to a small range.
Keywords
CMOS integrated circuits; automatic test pattern generation; genetic algorithms; integer programming; linear programming; power supply circuits; CMOS circuit; genetic algorithm; integer linear programming; maximum instantaneous current; power supply line; probabilistic model; timed ATPG; Associate members; Circuit simulation; Current supplies; Delay estimation; Power supplies; Switching circuits; Testing; Upper bound; Very large scale integration; Voltage;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/92.820762
Filename
820762
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