DocumentCode :
1297770
Title :
Estimation for maximum instantaneous current through supply lines for CMOS circuits
Author :
Jiang, Yi-Min ; Krstic, Angela ; Cheng, Kwang-Ting
Author_Institution :
Synopsys, Mountain View, CA, USA
Volume :
8
Issue :
1
fYear :
2000
Firstpage :
61
Lastpage :
73
Abstract :
We present new techniques for estimating the maximum instantaneous current through the power supply lines for CMOS circuits. We investigate four different approaches: (1) timed-ATPG-based approach; (2) probability-based approach; (3) genetic algorithm-based approach; and (4) integer linear programming (ILP) approach. The first three approaches produce a tight lower bound on the maximum current. The ILP-based approach produces the exact solutions for small circuits, and tight upper bounds of the solutions for large circuits. Our experimental results show that the upper bounds produced by the ILP approach combined with the lower bounds produced by the other three approaches confine the exact solution for the maximum instantaneous current to a small range.
Keywords :
CMOS integrated circuits; automatic test pattern generation; genetic algorithms; integer programming; linear programming; power supply circuits; CMOS circuit; genetic algorithm; integer linear programming; maximum instantaneous current; power supply line; probabilistic model; timed ATPG; Associate members; Circuit simulation; Current supplies; Delay estimation; Power supplies; Switching circuits; Testing; Upper bound; Very large scale integration; Voltage;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.820762
Filename :
820762
Link To Document :
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