• DocumentCode
    1297770
  • Title

    Estimation for maximum instantaneous current through supply lines for CMOS circuits

  • Author

    Jiang, Yi-Min ; Krstic, Angela ; Cheng, Kwang-Ting

  • Author_Institution
    Synopsys, Mountain View, CA, USA
  • Volume
    8
  • Issue
    1
  • fYear
    2000
  • Firstpage
    61
  • Lastpage
    73
  • Abstract
    We present new techniques for estimating the maximum instantaneous current through the power supply lines for CMOS circuits. We investigate four different approaches: (1) timed-ATPG-based approach; (2) probability-based approach; (3) genetic algorithm-based approach; and (4) integer linear programming (ILP) approach. The first three approaches produce a tight lower bound on the maximum current. The ILP-based approach produces the exact solutions for small circuits, and tight upper bounds of the solutions for large circuits. Our experimental results show that the upper bounds produced by the ILP approach combined with the lower bounds produced by the other three approaches confine the exact solution for the maximum instantaneous current to a small range.
  • Keywords
    CMOS integrated circuits; automatic test pattern generation; genetic algorithms; integer programming; linear programming; power supply circuits; CMOS circuit; genetic algorithm; integer linear programming; maximum instantaneous current; power supply line; probabilistic model; timed ATPG; Associate members; Circuit simulation; Current supplies; Delay estimation; Power supplies; Switching circuits; Testing; Upper bound; Very large scale integration; Voltage;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.820762
  • Filename
    820762