• DocumentCode
    1297799
  • Title

    Fast frequency sweep technique for the efficient analysis of dielectric waveguides

  • Author

    Polstyanko, Sergey V. ; Dyczij-Edlinger, Romanus ; Lee, Jin-Fa

  • Author_Institution
    Worcester Polytech. Inst., MA, USA
  • Volume
    45
  • Issue
    7
  • fYear
    1997
  • fDate
    7/1/1997 12:00:00 AM
  • Firstpage
    1118
  • Lastpage
    1126
  • Abstract
    This paper describes a new approach to spectral response computations of an arbitrary two-dimensional (2-D) waveguide. This technique is based on the tangential-vector finite-element method (TVFEM) in conjunction with the asymptotic waveform evaluation (AWE) technique. The former is used to obtain modes characteristics for a central frequency, whereas the latter employs an efficient algorithm to compute frequency moments for each mode. These moments are then matched via Pade approximation to a reduced-order rational polynomial, which can be used to interpolate each mode over a frequency band with a high degree of accuracy. Furthermore, the moments computations and subsequent interpolation for a given set of frequency points can be done much more rapidly than just simple simulations for each frequency point.
  • Keywords
    approximation theory; dielectric waveguides; finite element analysis; interpolation; iterative methods; polynomials; waveguide theory; 2D waveguide; AWE technique; Pade approximation; asymptotic waveform evaluation; dielectric waveguides; fast frequency sweep technique; finite-element method; frequency moments; interpolation; modes characteristics; moments computations; reduced-order rational polynomial; spectral response computations; tangential-vector FEM; two-dimensional waveguide; Computational modeling; Dielectrics; Electromagnetic propagation; Electromagnetic waveguides; Equations; Finite element methods; Frequency; Interpolation; Optical waveguides; Polynomials;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.598450
  • Filename
    598450