• DocumentCode
    1297817
  • Title

    Does velocity overshoot reduce collector delay time in AlGaAs/GaAs HBTs?

  • Author

    Das, Amitava ; Lundstrom, Mark

  • Author_Institution
    Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    12
  • Issue
    6
  • fYear
    1991
  • fDate
    6/1/1991 12:00:00 AM
  • Firstpage
    335
  • Lastpage
    337
  • Abstract
    The effect of velocity overshoot on the collector delay in an AlGaAs/GaAs heterojunction bipolar transistor (HBT) is examined. A new impulse response technique to rigorously evaluate the total transit-time delay using transient Monte-Carlo simulation is introduced. By applying the technique to a conventional HBT and comparing the result with a similar calculation ignoring the effects of velocity overshoot, it is found that velocity overshoot effects are difficult to observe in the normal operating range of base-collector bias. Impulse response analysis predicts that velocity overshoot should reduce the collector delay in AlGaAs/GaAs HBTs but the effect should rapidly diminish with increasing bias. It is also shown that impulse response is sensitive to the field profile. Intentional, unintentional, or current-induced variations in the collector field profile may have substantial effects on collector delay.<>
  • Keywords
    III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; base-collector bias; collector delay time; collector field profile; heterojunction bipolar transistor; impulse response technique; modelling; semiconductors; total transit-time delay; transient Monte-Carlo simulation; velocity overshoot; Bipolar transistors; Delay effects; Delay estimation; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Space charge; Space technology; Thermionic emission; Trajectory;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.82079
  • Filename
    82079