Title :
WLD: A Robust Local Image Descriptor
Author :
Chen, Jie ; Shan, Shiguang ; He, Chu ; Zhao, Guoying ; Pietikäinen, Matti ; Chen, Xilin ; Gao, Wen
Author_Institution :
Dept. of Electr. & Inf. Eng., Univ. of Oulu, Oulu, Finland
Abstract :
Inspired by Weber´s Law, this paper proposes a simple, yet very powerful and robust local descriptor, called the Weber Local Descriptor (WLD). It is based on the fact that human perception of a pattern depends not only on the change of a stimulus (such as sound, lighting) but also on the original intensity of the stimulus. Specifically, WLD consists of two components: differential excitation and orientation. The differential excitation component is a function of the ratio between two terms: One is the relative intensity differences of a current pixel against its neighbors, the other is the intensity of the current pixel. The orientation component is the gradient orientation of the current pixel. For a given image, we use the two components to construct a concatenated WLD histogram. Experimental results on the Brodatz and KTH-TIPS2-a texture databases show that WLD impressively outperforms the other widely used descriptors (e.g., Gabor and SIFT). In addition, experimental results on human face detection also show a promising performance comparable to the best known results on the MIT+CMU frontal face test set, the AR face data set, and the CMU profile test set.
Keywords :
face recognition; image resolution; image texture; visual databases; visual perception; Brodatz texture database; KTH-TIPS2-a texture database; Weber local descriptor; Weber´s Law; concatenated WLD histogram; differential excitation; differential orientation; gradient orientation; human face detection; human perception; image pixel; relative intensity differences; robust local Image Descriptor; stimulus; Pattern recognition; Weber law; face detection.; local descriptor; texture; Algorithms; Artificial Intelligence; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Pattern Recognition, Automated; Subtraction Technique;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2009.155