DocumentCode :
1298153
Title :
Behavioral modeling of microelectromechanical systems (MEMS) with statistical performance-variability reduction and sensitivity analysis
Author :
Dewey, Allen ; Ren, Hong ; Zhang, Tianhao
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Volume :
47
Issue :
2
fYear :
2000
fDate :
2/1/2000 12:00:00 AM
Firstpage :
105
Lastpage :
113
Abstract :
An approach to behavioral modeling of microelectromechanical systems (MEMS) is presented emphasizing robust design that minimizes the effects of device parametric variability on overall performance. Using a novel application of Taguchi experimental design and statistical process-control methods, statistical performance-variability reduction and parametric sensitivity analysis are studied. Taguchi performance-variability reduction and parametric sensitivity analyses introduce design-for-manufacturing into behavioral modeling. An example is given for the robust behavioral modeling of a microelectromechanical laterally driven electrostatic-comb microresonator. Applications of the behavioral-modeling approach to high-performance design, manufacturing yield optimization, and operational reliability assessment are also given
Keywords :
design for manufacture; design of experiments; micromechanical devices; micromechanical resonators; sensitivity analysis; statistical process control; Taguchi experimental design; behavioral model; design for manufacturing; electrostatic comb microresonator; manufacturing yield optimization; microelectromechanical system; operational reliability; parametric sensitivity analysis; robust design; statistical performance variability; statistical process control; Design for experiments; Design optimization; Fabrication; Integrated circuit yield; Manufacturing; Microelectromechanical systems; Microelectronics; Micromechanical devices; Robustness; Sensitivity analysis;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7130
Type :
jour
DOI :
10.1109/82.821550
Filename :
821550
Link To Document :
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