Title :
Poly-Si thin-film transistors on steel substrates
Author :
Howell, R.S. ; Stewart, M. ; Kamik, S.V. ; Saha, S.K. ; Hatalis, M.K.
Author_Institution :
Display Res. Lab., Lehigh Univ., Bethlehem, PA, USA
Abstract :
We report the successful fabrication of poly-Si thin-film transistors (TFTs) on stainless steel substrates. The TFTs were fabricated on a 500 μm thick polished stainless steel substrate using furnace crystallized amorphous Si deposited by PECVD. These devices typically have threshold voltages of 8.6 V, linear effective mobilities of 6.2 cm2/V/spl middot/s and subthreshold slopes of 0.93 decade/V. This work demonstrates the feasibility of poly-Si TFTs on stainless steel substrates and identifies some critical issues involved in poly Si processing on stainless steel. This will enable the fabrication of arrays with integrated drivers on a cheap, flexible and durable substrate for various displays and other large area array microelectronic applications.
Keywords :
carrier mobility; elemental semiconductors; plasma CVD; semiconductor growth; silicon; thin film transistors; 500 micron; 8.6 V; FeCrC; PECVD; Si-FeCrC; furnace crystallized material; integrated drivers; large area array microelectronic applications; linear effective mobilities; polysilicon thin-film transistors; stainless steel substrates; subthreshold slopes; threshold voltages; Amorphous materials; Crystallization; Displays; Fabrication; Furnaces; Microelectronics; Steel; Substrates; Thin film transistors; Threshold voltage;
Journal_Title :
Electron Device Letters, IEEE