• DocumentCode
    1298273
  • Title

    A LDMOS technology compatible with CMOS and passive components for integrated RF power amplifiers

  • Author

    Tan, Y. ; Kumar, M. ; Sin, J.K.O. ; Cai, J. ; Lau, J.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong
  • Volume
    21
  • Issue
    2
  • fYear
    2000
  • Firstpage
    82
  • Lastpage
    84
  • Abstract
    The authors describe a bulk silicon LDMOS technology, which is compatible with CMOS and passive components, for the implementation of RF integrated power amplifiers (IPA´s) used in portable wireless communication applications. This technology allows complete integration of the low cost and low power front-end circuits with the baseband circuits for single-chip wireless communication systems. The LDMOS transistor (0.35 μm channel length, 3.85 μm drift length, 3 GHz fT and 20 V breakdown voltage), CMOS transistors (1.5 μm channel length), and high Q-factor (up to 6.10 at 900 MHz and 7.14 at 1.8 GHz) on-chip inductor are designed and fabricated to show the feasibility of the IPA implementation.
  • Keywords
    CMOS integrated circuits; UHF field effect transistors; UHF integrated circuits; UHF power amplifiers; elemental semiconductors; integrated circuit technology; mobile radio; power MOSFET; power integrated circuits; silicon; transceivers; 1.5 to 3.85 micron; 20 V; 3 GHz; 900 MHz to 1.8 GHz; CMOS compatible technology; CMOS transistors; LDMOS transistor; Si; baseband circuits; bulk Si LDMOS technology; high Q-factor onchip inductor; integrated RF power amplifiers; lateral DMOS technology; low power front-end circuits; passive components; portable wireless communication applications; single-chip wireless communication systems; Baseband; CMOS technology; Costs; Integrated circuit technology; Power amplifiers; Q factor; Radio frequency; Radiofrequency amplifiers; Silicon; Wireless communication;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.821677
  • Filename
    821677