• DocumentCode
    1298887
  • Title

    Measurement of hydroxyl radicals in an atmospheric pressure discharge plasma by using laser-induced fluorescence

  • Author

    Ono, Ryo ; Oda, Tetsuji

  • Author_Institution
    Dept. of Electr. Eng., Tokyo Univ., Japan
  • Volume
    36
  • Issue
    1
  • fYear
    2000
  • Firstpage
    82
  • Lastpage
    86
  • Abstract
    Hydroxyl radicals were measured by laser-induced fluorescence using a tunable KrF excimer laser in an atmospheric pressure discharge plasma. The temporal behavior of OH radical, generated by a pulsed arc discharge, was measured in the post-discharge region. It was shown that OH radicals were generated by dissociation of H2O. The dissociation was mainly affected by oxygen concentration because OH density increased with oxygen concentration. The peak of OH density appeared tens of microseconds after discharge. After the peak, OH decreased exponentially with a decay time constant of tens of microseconds. Since oxygen accelerated the OH decay rate, OH was thought to react with products made by oxygen. Two-dimensional OH density distribution was also observed. OH radicals were generated uniformly along a discharge path, and then decreased in number with diffusion
  • Keywords
    chemical variables measurement; density measurement; discharges (electric); excimer lasers; measurement by laser beam; oxygen compounds; plasma; 2-D OH density distribution; H2O; H2O dissociation; KrF; OH; OH density; OH radical; atmospheric pressure discharge plasma; discharge path; hydroxyl radicals measurement; laser-induced fluorescence; oxygen concentration; post-discharge region; pulsed arc discharge; temporal behavior; tunable KrF excimer laser; Atmospheric measurements; Atmospheric-pressure plasmas; Fluorescence; Measurement by laser beam; Optical pulse generation; Plasma density; Plasma measurements; Pressure measurement; Pulse measurements; Tunable circuits and devices;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/28.821800
  • Filename
    821800