DocumentCode :
1298887
Title :
Measurement of hydroxyl radicals in an atmospheric pressure discharge plasma by using laser-induced fluorescence
Author :
Ono, Ryo ; Oda, Tetsuji
Author_Institution :
Dept. of Electr. Eng., Tokyo Univ., Japan
Volume :
36
Issue :
1
fYear :
2000
Firstpage :
82
Lastpage :
86
Abstract :
Hydroxyl radicals were measured by laser-induced fluorescence using a tunable KrF excimer laser in an atmospheric pressure discharge plasma. The temporal behavior of OH radical, generated by a pulsed arc discharge, was measured in the post-discharge region. It was shown that OH radicals were generated by dissociation of H2O. The dissociation was mainly affected by oxygen concentration because OH density increased with oxygen concentration. The peak of OH density appeared tens of microseconds after discharge. After the peak, OH decreased exponentially with a decay time constant of tens of microseconds. Since oxygen accelerated the OH decay rate, OH was thought to react with products made by oxygen. Two-dimensional OH density distribution was also observed. OH radicals were generated uniformly along a discharge path, and then decreased in number with diffusion
Keywords :
chemical variables measurement; density measurement; discharges (electric); excimer lasers; measurement by laser beam; oxygen compounds; plasma; 2-D OH density distribution; H2O; H2O dissociation; KrF; OH; OH density; OH radical; atmospheric pressure discharge plasma; discharge path; hydroxyl radicals measurement; laser-induced fluorescence; oxygen concentration; post-discharge region; pulsed arc discharge; temporal behavior; tunable KrF excimer laser; Atmospheric measurements; Atmospheric-pressure plasmas; Fluorescence; Measurement by laser beam; Optical pulse generation; Plasma density; Plasma measurements; Pressure measurement; Pulse measurements; Tunable circuits and devices;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/28.821800
Filename :
821800
Link To Document :
بازگشت