Title :
Topological conditions for single-branch-fault
Author :
Lin, C.S. ; Huang, Z.F. ; Liu, R.
Author_Institution :
University of Notre Dame, Notre Dame, IN; Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan, Republic of China
Abstract :
The testability condition for single branch-fault of an analog network is given. Then several necessary and sufficient conditions for this testability condition are provided and their proofs are shown in detail. These conditions have great applications in the testability design as demonstrated in the examples.
Keywords :
Current measurement; Cybernetics; Educational institutions; Joining processes; Symmetric matrices; TV; Vectors;
Journal_Title :
Systems, Man and Cybernetics, IEEE Transactions on
DOI :
10.1109/TSMC.1983.6313135
