Title :
Polarization Phenomena in TlBr Detectors
Author :
Hitomi, Keitaro ; Kikuchi, Yohei ; Shoji, Tadayoshi ; Ishii, Keizo
Author_Institution :
Dept. of Electron. & Intell. Syst., Tohoku Inst. of Technol., Sendai, Japan
Abstract :
A comparison of long-term stabilities of TlBr detectors with Au and Tl electrodes was performed in this study, in order to reveal polarization phenomena in TlBr detectors. Au/TlBr/Au detectors exhibited polarization phenomena at room temperature, observed as degradation of spectral performance and reduction of leakage current with elapsed time. Applying reverse bias voltage to the detectors recovered the detector performance temporarily. No polarization phenomena were observed in Tl/TlBr/Tl detectors at room temperature. The detector exhibited stable spectral performance for 24 hours.
Keywords :
electrodes; hole mobility; leakage currents; semiconductor counters; Au electrode; Au-TlBr-Au; Tl electrode; Tl-TlBr-Tl; TlBr detectors; hole mobility; leakage current; polarization phenomena; temperature 293 K to 298 K; time 24 hour; Degradation; Detectors; Electrodes; Gold; Leak detection; Leakage current; Polarization; Stability; Temperature; Voltage; Gamma-ray detectors; semiconductor detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2013349
