DocumentCode :
1299467
Title :
Implementing End-to-End Register Data-Flow Continuous Self-Test
Author :
Carretero, Javier ; Chaparro, Pedro ; Vera, Xavier ; Abella, Jaume ; González, Antonio
Author_Institution :
Intel Labs., UPC, Barcelona, Spain
Volume :
60
Issue :
8
fYear :
2011
Firstpage :
1194
Lastpage :
1206
Abstract :
While Moore´s Law predicts the ability of semiconductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in that law. One concern is the verification effort of modern computing systems, which has grown to dominate the cost of system design. On the other hand, technology scaling leads to burn-in phase out. As a result, in-the-field error rate may increase due to both actual errors and latent defects. Whereas data can be protected with arithmetic codes, there is a lack of cost-effective mechanisms for control logic. This paper presents a light-weight microarchitectural mechanism that ensures that data consumed through registers are correct. The structures protected include the issue queue logic and the data associated (i.e., tags and control signals), input multiplexors, rename data, replay logic, register free-list and release logic, and register file logic. Our results show a coverage around 90 percent for the targeted structures with a cost in power and area of about four percent, and without impact in performance.
Keywords :
arithmetic codes; data flow computing; formal logic; program testing; sensor fusion; Moore law; arithmetic codes; control logic; data association; end-to-end register data-flow continuous self-test; in-the-field error rate; input multiplexors; light-weight microarchitectural mechanism; queue logic; register file logic; transistors; Hardware; Multiplexing; Radiation detectors; Random access memory; Registers; Testing; Wires; Online testing; control logic.; degradation; design errors; end-to-end protection;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2010.179
Filename :
5551126
Link To Document :
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