Single-Event Upsets in Photoreceivers for Multi-Gb/s Data Transmission

Author

Pacheco, Alberto Jimenez ; Troska, Jan ; Amaral, Luis ; Dris, Stefanos ; Ricci, Daniel ; Sigaud, Christophe ; Vasey, François ; Vichoudis, Paschalis

Author_Institution

CERN, Geneva, Switzerland

Volume

56

Issue

4

fYear

2009

Firstpage

1978

Lastpage

1986

Abstract

A Single-Event Upset study has been carried out on p-i-n photodiodes from a range of manufacturers. A total of 22 devices of 11 types from six vendors were exposed to a beam of 63 MeV protons. The angle of incidence of the proton beam was varied between normal and grazing incidence for three data rates (1.5, 2.0 and 2.5 Gb/s).

Keywords

data communication; error statistics; optical fibre communication; optical receivers; p-i-n photodiodes; proton effects; custom-designed bit error rate tester; data transmission; electron volt energy 63 MeV; grazing incidence; optical fiber communication; optical power; optical receivers; p-i-n photodiodes; photoreceivers; proton beam; radiation effects; single-event upset study; Data communication; Error analysis; Forward error correction; Optical receivers; PIN photodiodes; Particle beams; Power measurement; Single event upset; Statistical analysis; Testing; Optical fiber communication; optical receivers; photodiodes; radiation effects;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2009.2021836

Filename

5204641