Title :
Time Multiplexed Triple Modular Redundancy for Single Event Upset Mitigation
Author :
She, Xiaoxuan ; McElvain, K.S.
Author_Institution :
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
Abstract :
This paper presents a time-multiplexed triple modular redundancy (TMR) scheme which detects and corrects single event upsets (SEUs) through time-multiplexed resource sharing. The time-multiplexed TMR method provides self-protection against SEUs in both computation logic and voting logic. Experimental results demonstrate that the proposed scheme can reduce area and power significantly in the TMR designs of single-channel circuits and multi-channel circuits.
Keywords :
application specific integrated circuits; field programmable gate arrays; logic circuits; nuclear electronics; position sensitive particle detectors; ASIC; FPGA; SEU; TMR; computation logic; multichannel circuits; single event upsets; single-channel circuits; time-multiplexed triple modular redundancy; Application specific integrated circuits; Delay; Event detection; Field programmable gate arrays; Logic; Payloads; Redundancy; Single event transient; Single event upset; Voting; Single event upset (SEU); time-multiplexed; triple modular redundancy (TMR);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2021656
