• DocumentCode
    1299602
  • Title

    Time Multiplexed Triple Modular Redundancy for Single Event Upset Mitigation

  • Author

    She, Xiaoxuan ; McElvain, K.S.

  • Author_Institution
    State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
  • Volume
    56
  • Issue
    4
  • fYear
    2009
  • Firstpage
    2443
  • Lastpage
    2448
  • Abstract
    This paper presents a time-multiplexed triple modular redundancy (TMR) scheme which detects and corrects single event upsets (SEUs) through time-multiplexed resource sharing. The time-multiplexed TMR method provides self-protection against SEUs in both computation logic and voting logic. Experimental results demonstrate that the proposed scheme can reduce area and power significantly in the TMR designs of single-channel circuits and multi-channel circuits.
  • Keywords
    application specific integrated circuits; field programmable gate arrays; logic circuits; nuclear electronics; position sensitive particle detectors; ASIC; FPGA; SEU; TMR; computation logic; multichannel circuits; single event upsets; single-channel circuits; time-multiplexed triple modular redundancy; Application specific integrated circuits; Delay; Event detection; Field programmable gate arrays; Logic; Payloads; Redundancy; Single event transient; Single event upset; Voting; Single event upset (SEU); time-multiplexed; triple modular redundancy (TMR);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2021656
  • Filename
    5204663
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1299602