DocumentCode
1299740
Title
Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits
Author
Roche, Nicolas Jean-Henri ; Velo, Yago Gonzalez ; Dusseau, Laurent ; Boch, Jérôme ; Vaillé, Jean-Roch ; Saigné, Frédéric ; Azais, Bruno ; Auriel, Gérard ; Lorfèvre, Eric ; Pouget, Vincent ; Buchner, Stephen P. ; David, Jean-Pierre ; Marec, Ronan ; Calvel,
Author_Institution
IES, Univ. Montpellier II, Montpellier, France
Volume
56
Issue
4
fYear
2009
Firstpage
1971
Lastpage
1977
Abstract
An accelerated irradiation technique is used to study dose-ASET synergy effects. The impact of TID on SET is found to be identical when the dose rate is switched from high to low or from low to high.
Keywords
bipolar integrated circuits; radiation effects; TID; accelerated irradiation method; bipolar integrated circuits; dose-ASET synergy effects; Acceleration; Analog integrated circuits; Bipolar integrated circuits; Circuit testing; Degradation; Integrated circuit technology; Integrated circuit testing; Laser beams; Pulse circuits; Pulsed laser deposition; Analog single event transient; bipolar analog integrated circuits; pulsed-laser testing; total ionizing dose;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2009.2015313
Filename
5204685
Link To Document