• DocumentCode
    1299746
  • Title

    Study on Instability Phenomena in CdTe Diode-Like Detectors

  • Author

    Farella, I. ; Montagna, G. ; Mancini, A.M. ; Cola, A.

  • Author_Institution
    Unit of Lecce, CNR/IMM, Lecce, Italy
  • Volume
    56
  • Issue
    4
  • fYear
    2009
  • Firstpage
    1736
  • Lastpage
    1742
  • Abstract
    Diode-like In/CdTe/Pt detectors are widely used thanks to their excellent spectroscopic performance. However, when operated at room temperature they are not stable, and their performance degrades with time. The aim of this paper is to investigate in detail the physical mechanisms underlying this effect, by studying the evolution of the space charge inside the detector. Our approach makes use of the Pockels effect, by looking at the evolution of the electric field distribution inside the detector at different temperatures. The results show that a negative space charge accumulation occurs at the anode and that the process is thermally activated. The effect is attributed to a midgap acceptor which, under reverse bias, increases its ionization because of hole detrapping. Moreover, we compare the results with those obtained on stable detectors realized from nominally same crystals but having ldquostandard,rdquo i.e., not rectifying contacts. Consistently with the detection performance stability of this kind of detectors, the electric field is relatively stable. Furthermore, it decreases from cathode and it shows peculiar features which will be discussed in conjunction with charge transport properties.
  • Keywords
    Pockels effect; semiconductor counters; space charge; Pockels effect; charge transport properties; diode-like In-CdTe-Pt detectors; electric field distribution; instability phenomena; negative space charge accumulation; temperature 293 K to 298 K; Anodes; Crystals; Degradation; Detectors; Diodes; Ionization; Space charge; Spectroscopy; Stability; Temperature distribution; CdTe; Pockels effect; Schottky barrier; X-ray detectors; polarization; space charge;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2017020
  • Filename
    5204686