Title :
Double correlating interferometer scheme for measuring PM and AM noise
Author :
Rubiola, E. ; Giordano, V. ; Groslambert, J.
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
fDate :
1/8/1998 12:00:00 AM
Abstract :
A new scheme is proposed to measure close-to-carrier PM and AM noise by means of correlation between two interferometric measurements. The most relevant feature is the ability to reject interferometric system noise, thus improving the sensitivity. Implementation and experimental results are discussed
Keywords :
amplitude modulation; correlation methods; electric noise measurement; electromagnetic wave interferometry; microwave measurement; phase modulation; AM noise; PM noise; close-to-carrier noise; double correlating interferometer; interferometric measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19980129
