DocumentCode
130008
Title
A novel surface defect detection method of cold rolled strips based on Artificial Immune System
Author
Guifang Wu ; Xiuming Sun ; Jiexin Pu ; Haitao Zhang
Author_Institution
Inf. Eng. Coll., Henan Univ. of Sci. & Technol., Luoyang, China
fYear
2014
fDate
28-30 July 2014
Firstpage
279
Lastpage
283
Abstract
Because surface defect image of cold rolled strips is disturbed by mass of noise information, as well as the image quality problem of inadequate illumination or uneven illumination, it will raise great difficulty when detecting the defect with traditional image process methods such as mathematic morphology, and it cannot get an ideal treatment effect. According to the problem, and combining the self-organizing and self-recognition features of Artificial Immune System technology, surface defect detection method of cold rolled strips based on AIS is studied. By assuring the including relationships among detectors and antigens, and the position information of self-body in domain space, the block space mode is introduced to present a block generating algorithm based on detector, and applied to detect surface defect image of cold rolled strips. Experiments show that this method is significantly superior in defect extraction to traditional defect image detection algorithms not only for images with low-contrast but also for images with inadequate illumination or uneven illumination.
Keywords
artificial immune systems; cold rolling; image recognition; strips; AIS; antigens; artificial immune system technology; block space mode; cold rolled strips; defect extraction; defect image detection algorithms; image process methods; image quality problem; inadequate illumination; mathematic morphology; noise information; self-organizing features; self-recognition features; surface defect detection method; surface defect image; uneven illumination; Detectors; Image edge detection; Immune system; Lighting; Mathematics; Strips; Surface morphology; Artificial Immune System (AIS); antigen; cold rolled strips; defect detection; image process;
fLanguage
English
Publisher
ieee
Conference_Titel
Information and Automation (ICIA), 2014 IEEE International Conference on
Conference_Location
Hailar
Type
conf
DOI
10.1109/ICInfA.2014.6932667
Filename
6932667
Link To Document