DocumentCode :
1300263
Title :
Electrorefraction in GaInAs/InP multiple quantum well heterostructures
Author :
Zucker, J.E. ; Bar-Joseph, I. ; Sucha, G. ; Koren, U. ; Miller, B.I. ; Chemla
Author_Institution :
AT&T Bell Labs., Holmdel, NJ
Volume :
24
Issue :
8
fYear :
1988
fDate :
4/14/1988 12:00:00 AM
Firstpage :
458
Lastpage :
460
Abstract :
Reports the first absolute measurement of electric-field-induced changes in refractive index in GaInAs quantum well heterostructures. Even for wavelengths as far as 40 meV below the absorption edge, excitonic effects dominate electro-optic phase modulation. This effect close to resonance yields index changes two orders of magnitude larger than in bulk material. The authors find that the size of the index change, its dependence on applied voltage, and its behaviour with wavelength are well described in terms of the quantum confined Stark effect on excitonic absorption
Keywords :
III-V semiconductors; electro-optical devices; gallium arsenide; indium compounds; semiconductor superlattices; GaInAs-InP; MQW; QCSE; absolute measurement; absorption edge; dependence on applied voltage; effect close to resonance; electric-field-induced changes in refractive index; electro-optic phase modulation; electrorefraction; excitonic effects; index change; multiple quantum well heterostructures; quantum confined Stark effect on excitonic absorption; semiconductors; wavelength dependence;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
Filename :
8231
Link To Document :
بازگشت