Title :
Valley operator for extracting sketch features: DIP
Author :
Ryoo, Y.J. ; Kim, N.-C.
Author_Institution :
Dept. of Electr. Eng., Kyungpook Nat. Univ., Taegu
fDate :
4/14/1988 12:00:00 AM
Abstract :
A new valley operator is presented for extracting sketch features which contain valleys and edges subject to local intensities. It is a very simple operator using local probabilities in a 3×3 local window. Experimental results show its excellent performance compared with existing valley or edge operators
Keywords :
computerised pattern recognition; computerised picture processing; 3×3 local window; computerised image processing; difference of inverse probabilities; edges; extracting sketch features; local intensities; local probabilities; performance; simple operator; valley operator; valleys;
Journal_Title :
Electronics Letters
