• DocumentCode
    1300386
  • Title

    Speed and power scaling of SRAM´s

  • Author

    Amrutur, Bharadwaj S. ; Horowitz, Mark A.

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA, USA
  • Volume
    35
  • Issue
    2
  • fYear
    2000
  • Firstpage
    175
  • Lastpage
    185
  • Abstract
    Simple models for the delay, power, and area of a static random access memory (SRAM) are used to determine the optimal organizations for an SRAM and study the scaling of their speed and power with size and technology. The delay is found to increase by about one gate delay for every doubling of the RAM size up to 1 Mb, beyond which the interconnect delay becomes an increasingly significant fraction of the total delay. With technology scaling, the nonscaling of threshold mismatches in the sense amplifiers is found to significantly impact the total delay in generations of 0.1 /spl mu/m and below.
  • Keywords
    SRAM chips; delays; integrated circuit interconnections; memory architecture; 0.1 micron; RAM size; SRAMs; area; gate delay; interconnect delay; power; sense amplifiers; threshold mismatches; total delay; Analytical models; Decoding; Delay effects; Delay estimation; Energy consumption; Integrated circuit interconnections; Random access memory; Read-write memory; SRAM chips; Transistors;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.823443
  • Filename
    823443