DocumentCode
1300386
Title
Speed and power scaling of SRAM´s
Author
Amrutur, Bharadwaj S. ; Horowitz, Mark A.
Author_Institution
Center for Integrated Syst., Stanford Univ., CA, USA
Volume
35
Issue
2
fYear
2000
Firstpage
175
Lastpage
185
Abstract
Simple models for the delay, power, and area of a static random access memory (SRAM) are used to determine the optimal organizations for an SRAM and study the scaling of their speed and power with size and technology. The delay is found to increase by about one gate delay for every doubling of the RAM size up to 1 Mb, beyond which the interconnect delay becomes an increasingly significant fraction of the total delay. With technology scaling, the nonscaling of threshold mismatches in the sense amplifiers is found to significantly impact the total delay in generations of 0.1 /spl mu/m and below.
Keywords
SRAM chips; delays; integrated circuit interconnections; memory architecture; 0.1 micron; RAM size; SRAMs; area; gate delay; interconnect delay; power; sense amplifiers; threshold mismatches; total delay; Analytical models; Decoding; Delay effects; Delay estimation; Energy consumption; Integrated circuit interconnections; Random access memory; Read-write memory; SRAM chips; Transistors;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.823443
Filename
823443
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