Title :
Three-stage large capacitive load amplifier with damping-factor-control frequency compensation
Author :
Leung, Ka Nang ; Mok, Philip K T ; Ki, Wing-Hung ; Sin, Johnny K O
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Clear Water Bay, Hong Kong
Abstract :
A novel damping-factor-control frequency compensation (DFCFC) technique is presented in this paper with detailed theoretical analysis, This compensation technique improves frequency response, transient response, and power supply rejection for amplifiers, especially when driving large capacitive loads, Moreover, the required compensation capacitors are small and can be easily integrated in commercial CMOS process. Amplifiers using DFCPC and nested Miller compensation (NMC) driving two capacitive loads, 100 and 1000 pF, were fabricated using a 0.8-/spl mu/m CMOS process with V/sub tn/=0.72 V and V/sub tp/=-0.75 V. For the DFCFC amplifier driving a 1000-pF load, a 1-MHz gain-bandwidth product, 51/spl deg/ phase margin, 0.33-V//spl mu/s slew rate, 3.54-/spl mu/s settling time, and 426-/spl mu/W power consumption are obtained with integrated compensation capacitors. Compared to the NMC amplifier, the frequency and transient responses of the DFCFC amplifier are improved by one order of magnitude with insignificant increase of the power consumption.
Keywords :
VLSI; circuit stability; compensation; feedback amplifiers; frequency response; integrated circuit design; operational amplifiers; transient response; 0.8 micron; 100 pF; 1000 pF; 3.54 mus; 426 muW; damping-factor-control frequency compensation; frequency response; gain-bandwidth product; integrated compensation capacitors; nested Miller compensation; phase margin; power consumption; power supply rejection; settling time; slew rate; three-stage large capacitive load amplifier; transient response; Bandwidth; CMOS process; Capacitors; Circuit topology; Energy consumption; Frequency; Power amplifiers; Power supplies; Transient response; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
