Title :
Total reflection mirrors fabricated on silica waveguides with focused ion beam
Author :
Watanabe, K. ; Schrauwen, J. ; Leinse, Arne ; Thourhout, D.V. ; Heideman, Rene ; Baets, Roel
Author_Institution :
Photonics Res. Group, Ghent Univ.-IMEC, Ghent, Belgium
Abstract :
Efficient total reflection mirrors are fabricated on silica-based waveguides by direct milling with a focused ion beam. To reduce the excess losses of the mirrors, a two-step milling technique is employed that reduces the roughness of the mirror surface while maintaining a high milling rate. A focused ion beam is used to fabricate low-loss mirrors with small excess losses of about 1.0 dB.
Keywords :
focused ion beam technology; milling; mirrors; optical waveguides; silicon compounds; surface roughness; SiO2; direct milling; focused ion beam; mirror surface roughness; silica waveguides; total reflection mirrors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2009.0473