Title :
Design criteria of 1.3-μm multiple-quantum-well lasers for high-temperature operation
Author :
Yamamoto, N. ; Seki, S. ; Noguchi, Y. ; Kondo, S.
Author_Institution :
NTT Photonic Labs., Kanagawa, Japan
Abstract :
We present design criteria for high-temperature operation in 1.3-μm multiple-quantum-well (MQW) lasers from the viewpoint of the light output power penalty, i.e., the change in the light output power at a fixed drive current with increasing temperature. It is shown that not only the characteristic temperature (T0) but also internal loss dependence on temperature (/spl gamma/) and threshold current (I/sub th/) are significant parameters for reducing the power penalty. We compare the high-temperature performance of InGaAsP-based and AlGaInAs-based MQW lasers and demonstrate that AlGaInAs-based lasers have more potential in terms of the power penalty. Furthermore, we also demonstrate that the power penalty can be reduced by introducing a buried-heterostructure (BH) structure into AlGaInAs-based lasers. From these results, we conclude that the AlGaInAs-based BH lasers are promising for high-temperature performance.
Keywords :
III-V semiconductors; MOCVD; aluminium compounds; gallium arsenide; gallium compounds; indium compounds; laser beams; optical design techniques; optical fabrication; optical losses; quantum well lasers; vapour phase epitaxial growth; 1.3 mum; AlGaInAs; AlGaInAs-based multiple quantum well laser; InGaAsP; InGaAsP-based multiple quantum well laser; buried-heterostructure structure; characteristic temperature; design criteria; fixed drive current; high-temperature operation; high-temperature performance; increasing temperature; internal loss dependence; light output power; light output power penalty; multiple-quantum-well lasers; power penalty; temperature; threshold current; Fiber lasers; Optical design; Power generation; Power lasers; Quantum well devices; Quantum well lasers; Semiconductor lasers; Temperature dependence; Temperature sensors; Threshold current;
Journal_Title :
Photonics Technology Letters, IEEE