• DocumentCode
    1300763
  • Title

    A pseudologarithmic rectifier using unbalanced bias MFMOS differential pairs

  • Author

    Mehrvarz, Hamid Reza ; Kwok, Chee Yee

  • Author_Institution
    Sch. of Electr. Eng., New South Wales Univ., Kensington, NSW, Australia
  • Volume
    33
  • Issue
    1
  • fYear
    1998
  • fDate
    1/1/1998 12:00:00 AM
  • Firstpage
    28
  • Lastpage
    35
  • Abstract
    A pseudologarithmic rectifier using multi-input floating-gate MOS (MFMOS) transistors is presented in this paper. The rectifiers consist of unbalanced bias matched MFMOS transistor differential pairs. The transfer characteristics of each subrectifier are determined by an appropriate choice of transistor aspect ratio and capacitive input coupling ratio such that in the summation of the output currents from each rectifier stage, the overall transfer characteristics closely approximates that of a true logarithmic behavior. It is operable at low supply voltage (±0.9 V) and has low temperature dependence. Measured dynamic range of 27 dB and 16.5 dB, with a corresponding logarithmic error of ±0.7 dB and ±0.35 dB, has been obtained for three-stage and two-stage pseudologarithmic rectifiers, respectively, at room temperature. The measured logarithmic error for the three-stage pseudologarithmic rectifier at 125°C is ±1.05 dB which is an increase of ±0.35 dB over a 100°C range
  • Keywords
    MOSFET circuits; solid-state rectifiers; 0.9 V; 125 C; aspect ratio; capacitive input coupling ratio; dynamic range; logarithmic error; low voltage circuit; multi-input floating-gate MOS transistor; pseudologarithmic rectifier; temperature dependence; three-stage rectifier; transfer characteristics; two-stage rectifier; unbalanced bias matched MFMOS differential pair; CMOS technology; Capacitance; Differential amplifiers; Dynamic range; Low voltage; MOSFETs; Rectifiers; Temperature dependence; Temperature distribution; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.654934
  • Filename
    654934