DocumentCode :
1300781
Title :
Mining Crosscutting Concerns through Random Walks
Author :
Zhang, Charles ; Jacobsen, Hans-Arno
Author_Institution :
Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
Volume :
38
Issue :
5
fYear :
2012
Firstpage :
1123
Lastpage :
1137
Abstract :
Inspired by our past manual aspect mining experiences, this paper describes a probabilistic random walk model to approximate the process of discovering crosscutting concerns (CCs) in the absence of the domain knowledge about the investigated application. The random walks are performed on the concept graphs extracted from the program sources to calculate metrics of “utilization” and “aggregation” for each of the program elements. We rank all the program elements based on these metrics and use a threshold to produce a set of candidates that represent crosscutting concerns. We implemented the algorithm as the Prism CC miner (PCM) and evaluated PCM on Java applications ranging from a small-scale drawing application to a medium-sized middleware application and to a large-scale enterprise application server. Our quantification shows that PCM is able to produce comparable results (95 percent accuracy for the top 125 candidates) with respect to the manual mining effort. PCM is also significantly more effective as compared to the conventional approach.
Keywords :
Java; aspect-oriented programming; data mining; graph theory; middleware; probability; small-to-medium enterprises; Java applications; Prism CC miner; aggregation metric; aspect mining; concept graphs; crosscutting concerns mining; large-scale enterprise application server; medium-sized middleware application; probabilistic random walk model; program elements; program sources; small-scale drawing application; utilization metric; Algorithm design and analysis; Computational modeling; Data mining; Manuals; Mathematical model; Phase change materials; Radiation detectors; Aspect mining; mining crosscutting concerns;
fLanguage :
English
Journal_Title :
Software Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-5589
Type :
jour
DOI :
10.1109/TSE.2011.83
Filename :
5989837
Link To Document :
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