DocumentCode :
1300791
Title :
Temperature-Aware Integrated DVFS and Power Gating for Executing Tasks With Runtime Distribution
Author :
Kang, Kyungsu ; Kim, Jungsoo ; Yoo, Sungjoo ; Kyung, Chong-Min
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Volume :
29
Issue :
9
fYear :
2010
Firstpage :
1381
Lastpage :
1394
Abstract :
At high-operating temperature, chip cooling is crucial due to the exponential temperature dependence of leakage current. However, traditional cooling methods, e.g., power/clock gating applied when a temperature threshold is reached, often cause excessive performance degradation. In this paper, we propose a method for delivering lower energy consumption by integrating the cooling and running in a temperature-aware manner without incurring performance penalty. In order to further reduce the energy consumption, we exploited the runtime distribution of each sub-segment of a task called “bin” in an analytical manner such that time budget for cooling in each bin is allocated in proportion to the probability of the occurrence of the bin. We apply the proposed method to two realistic software programs, H.264 decoder and ray tracing and a benchmark program, equake. The experimental results show that the proposed method yields additional 19.4%-27.2% reduction in energy consumption compared with existing methods.
Keywords :
cooling; leakage currents; power aware computing; H.264 decoder; benchmark program; chip cooling method; dynamic voltage and frequency scaling; equake; high-operating temperature; leakage current; performance penalty; power gating; ray tracing; runtime distribution; software program; temperature-aware integrated DVFS; Clocks; Cooling; Energy consumption; Estimation; Indexes; Power demand; Runtime; Dynamic voltage and frequency scaling (DVFS); energy minimization; hard real time; power gating (PG); runtime distribution;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2010.2059290
Filename :
5552187
Link To Document :
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