Title :
Robust Fault Models Where Undetectable Faults Imply Logic Redundancy
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
We define a robust fault model as a model where the existence of an undetectable fault implies the existence of logic redundancy. The stuck-at fault model is robust, but other fault models such as certain bridging and interconnect open fault models are not. A robust fault model provides a mechanism to synthesize circuits in which all the target faults are detectable and 100% fault coverage is achievable. This is important since it provides a direct link between test quality and the circuit synthesis. We discuss robust fault models for bridging faults and interconnect open faults, and their use as part of a test generation process for a non-robust fault model.
Keywords :
circuit testing; fault tolerance; network synthesis; redundancy; circuit synthesis; logic redundancy; robust fault models; stuck-at fault model; test quality; undetectable faults; Bridging faults; interconnect open faults; logic redundancy; test generation; undetectable faults;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2009.2020592