• DocumentCode
    1301108
  • Title

    Signal and Power Integrity Analysis of Differential Lines in Multilayer Printed Circuit Boards With Embedded Electromagnetic Bandgap Structures

  • Author

    Scogna, Antonio Ciccomancini ; Orlandi, Antonio ; Ricchiuti, Vittorio

  • Author_Institution
    Comput. Simulation Technol. (CST) of America, Framingham, MA, USA
  • Volume
    52
  • Issue
    2
  • fYear
    2010
  • fDate
    5/1/2010 12:00:00 AM
  • Firstpage
    357
  • Lastpage
    364
  • Abstract
    In this paper, the analysis of the signal integrity and the power integrity (PI) performance of different types of electromagnetic bandgap structures (EBGs) in presence of differential (DIFF) striplines is proposed. Four different configurations of 2-D embedded EBG layers are analyzed. A test vehicle consisting in a 12-layer printed circuit board in standard FR4 material is built, and the measured results (validated by means of 3-D electromagnetic simulations) are used to estimate the signal quality in terms of the transmission parameter S21, time-domain reflectometry, and eye pattern at the terminations. The PI is, instead, analyzed by means of the noise coefficient from the source to different positions along the planes (S21). Results confirm the reliability of 2-D EBGs for noise mitigation and the enhancement in the signal quality when DIFF signals are used.
  • Keywords
    S-parameters; photonic band gap; printed circuits; strip lines; 2D embedded EBG layers; 3D electromagnetic simulations; FR4 material; differential striplines; embedded electromagnetic bandgap structures; multilayer printed circuit boards; noise coefficient; noise mitigation; power integrity analysis; signal integrity analysis; signal quality estimation; time-domain reflectometry; transmission S-parameter; Circuit testing; Electromagnetic analysis; Materials testing; Metamaterials; Nonhomogeneous media; Performance analysis; Periodic structures; Printed circuits; Signal analysis; Stripline; Electromagnetic (EM) bandgap (EBG); finite-integration technique (FIT); power integrity (PI); signal integrity (SI);
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2009.2027125
  • Filename
    5208229