DocumentCode
1301697
Title
Relative Effectiveness Of Tests
Author
Butler, Katherine ; Maxwell, Paul ; Needham, W. ; Nig, P. ; Walther, R. ; Shianling Wu
Author_Institution
ASIC Software Engineering
Volume
15
Issue
1
fYear
1998
Firstpage
83
Lastpage
90
Keywords
Application specific integrated circuits; Delay; Educational institutions; Instruments; Materials testing; Organizing; Production materials; Test equipment; Uncertainty; Very large scale integration;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1998.655186
Filename
655186
Link To Document