Title :
Relative Effectiveness Of Tests
Author :
Butler, Katherine ; Maxwell, Paul ; Needham, W. ; Nig, P. ; Walther, R. ; Shianling Wu
Author_Institution :
ASIC Software Engineering
Keywords :
Application specific integrated circuits; Delay; Educational institutions; Instruments; Materials testing; Organizing; Production materials; Test equipment; Uncertainty; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1998.655186
