• DocumentCode
    1301755
  • Title

    Analog BIST Functionality for Microhotplate Temperature Sensors

  • Author

    Afridi, Muhammad ; Montgomery, Christopher B. ; Cooper-Balis, Elliott ; Semancik, Stephen ; Kreider, Kenneth G. ; Geist, Jon

  • Author_Institution
    Semicond. Electron. Div., NIST, Gaithersburg, MD, USA
  • Volume
    30
  • Issue
    9
  • fYear
    2009
  • Firstpage
    928
  • Lastpage
    930
  • Abstract
    In this letter, we describe a novel long-term microhotplate temperature-sensor calibration technique suitable for built-in self-test (BIST). The microhotplate thermal resistance (thermal efficiency) and the thermal voltage from an integrated platinum/rhodium thermocouple were calibrated against a polysilicon temperature-sensor calibration curve which drifts over time. Both of these temperature sensors, which cannot be directly calibrated, exhibit excellent long-term temperature stability and are appropriate for BIST functionality.
  • Keywords
    built-in self test; calibration; temperature sensors; thermal resistance; thermal stability; thermocouples; analog BIST functionality; built-in self-test; calibration technique; integrated platinum-rhodium thermocouple; long-term temperature stability; microhotplate temperature sensors; microhotplate thermal resistance; polysilicon temperature-sensor calibration; thermal efficiency; thermal voltage; Built-in self-test (BIST); calibration; microhotplate; platinum/rhodium; sensor; temperature; thermocouple;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2009.2027038
  • Filename
    5208336