DocumentCode :
1301775
Title :
Carbon Nanomaterials for Next-Generation Interconnects and Passives: Physics, Status, and Prospects
Author :
Li, Hong ; Xu, Chuan ; Srivastava, Navin ; Banerjee, Kaustav
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA, USA
Volume :
56
Issue :
9
fYear :
2009
Firstpage :
1799
Lastpage :
1821
Abstract :
This paper reviews the current state of research in carbon-based nanomaterials, particularly the one-dimensional (1-D) forms, carbon nanotubes (CNTs) and graphene nanoribbons (GNRs), whose promising electrical, thermal, and mechanical properties make them attractive candidates for next-generation integrated circuit (IC) applications. After summarizing the basic physics of these materials, the state of the art of their interconnect-related fabrication and modeling efforts is reviewed. Both electrical and thermal modeling and performance analysis for various CNT- and GNR-based interconnects are presented and compared with conventional interconnect materials to provide guidelines for their prospective applications. It is shown that single-walled, double-walled, and multiwalled CNTs can provide better performance than that of Cu. However, in order to make GNR interconnects comparable with Cu or CNT interconnects, both intercalation doping and high edge-specularity must be achieved. Thermal analysis of CNTs shows significant advantages in tall vias, indicating their promising application as through-silicon vias in 3-D ICs. In addition to on-chip interconnects, various applications exploiting the low-dimensional properties of these nanomaterials are discussed. These include chip-to-packaging interconnects as well as passive devices for future generations of IC technology. Specifically, the small form factor of CNTs and reduced skin effect in CNT interconnects have significant implications for the design of on-chip capacitors and inductors, respectively.
Keywords :
carbon nanotubes; electric properties; graphene; integrated circuit interconnections; thermal properties; 1D forms; 3D IC; carbon nanomaterials; carbon nanotube interconnects; chip-to-packaging interconnects; double-walled carbon nanotubes; electrical modeling; electrical property; graphene nanoribbons; inductors; intercalation doping; interconnect-related fabrication; mechanical property; modeling efforts; multiwalled carbon nanotubes; next-generation integrated circuit; next-generation interconnects; on-chip capacitors; on-chip interconnects; performance analysis; physics; single-walled carbon nanotubes; thermal analysis; thermal modeling; thermal property; through-silicon vias; Application specific integrated circuits; Carbon nanotubes; Doping; Fabrication; Guidelines; Integrated circuit interconnections; Mechanical factors; Nanomaterials; Performance analysis; Physics; Capacitor; carbon nanomaterials; double-walled carbon nanotube (CNT); energy storage; graphene nanoribbon (GNR); high-frequency; inductor; interconnects; multiwalled CNT; single-walled CNT; skin effect; through-silicon vias (TSVs);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2009.2026524
Filename :
5208340
Link To Document :
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